Determination of the quantitative composition of As-Se and Ge-Se glasses and films by X-ray fluorescence analysis
V. A. BordovskiĭHerzen Russian State Pedagogical University, nab. Reki Moiki 48, St. Petersburg, 191186, RussiaА. В. МарченкоHerzen Russian State Pedagogical University, nab. Reki Moiki 48, St. Petersburg, 191186, RussiaФ. С. НасрединовSt. Petersburg State Polytechnical University, Politekhnicheskaya ul. 29, St. Petersburg, 195251, RussiaM. Yu. Kozhokar’Herzen Russian State Pedagogical UniversityП. П. СерегинHerzen Russian State Pedagogical University, nab. Reki Moiki 48, St. Petersburg, 191186, Russia
2010en
ABI
Аннотация
A method of standards has been proposed for determining the quantitative contents of germanium, arsenic, and selenium in vitreous samples and films of the As1 − x Se x and Ge1 − x Se x compositions with the use of X-ray fluorescence analysis. The application of this technique makes it possible to determine the quantitative composition of As1 − x Se x and Ge1 − x Se x glasses and films with an accuracy of ±0.001 with respect to the parameter x.
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