Работы, цитирующие эту работу

Работ: 2

Работа: Technique for rapid inspection of hermetic seals of microelectronic packages using shearography

1. Digital Shearograph for Detecting Defect in Materials

   Z. T. Azamatov, V. E. Gaponov, Akylbek A. Jeenbekov +1

   СтатьяOptical measurement and interference techniquesRussian Microelectronics2023Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.403494

2. HOLOGRAPHIC PROPERTIES OF CHALCOGENIDE GLASSY SEMICONDUCTOR (CGS) FILMS

   Z. T. Azamatov, Mira Ruzimovna Bekchanova, Abror B. Bakhromov

   СтатьяPhase-change materials and chalcogenides2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.009652