Работы, цитирующие эту работу

Работ: 2

Работа: A comparison between linearized expressions of the temperature coefficient of resistance of polycrystalline films

1. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

   Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

   СтатьяCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics1980Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.603988

2. Electrical properties of fine crystalline and amorphous metal films, obtained by low temperature condensation (Review)

   Yu. F. Komnik

   СтатьяCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics1982Цитирований: 0

   ABIABI:AkademIndex/openalex/1982.article.000117