Работы, цитирующие эту работу

Работ: 2

Работа: Exact and approximate expressions for the temperature coefficient of resistivity of polycrystalline films using the Mayadas-Shatzkes model

1. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

   Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

   СтатьяCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics1980Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.603988

2. Electrical properties of fine crystalline and amorphous metal films, obtained by low temperature condensation (Review)

   Yu. F. Komnik

   СтатьяCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics1982Цитирований: 0

   ABIABI:AkademIndex/openalex/1982.article.000117