Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths
Austin J. MinnichDepartment of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USAJeremy A. JohnsonDepartment of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USAAaron J. SchmidtDepartment of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USAKeivan EsfarjaniDepartment of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USAM. S. DresselhausDepartment of Electrical Engineering and Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USAK. A. NelsonDepartment of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USAGang ChenDepartment of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
2011en
ABI
Аннотация
Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations.
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