Behavior of First- and Second-Kind Superconducting Films Near Their Critical Fields
J.P. BurgerService de Physique des Solides, Faculté des Sciences, Orsay, Seine et Oise, FranceG. DeutscherService de Physique des Solides, Faculté des Sciences, Orsay, Seine et Oise, FranceE. GuyonService de Physique des Solides, Faculté des Sciences, Orsay, Seine et Oise, FranceA. MartinetService de Physique des Solides, Faculté des Sciences, Orsay, Seine et Oise, France
1965en
ABI
Аннотация
The upper critical magnetic field of thin superconducting films has been studied as a function of its orientation with respect to the surface of the sample and as a function of the film thickness compared with $\ensuremath{\lambda}(T)$ and $\ensuremath{\xi}(T)$, for second-kind (Sn-In, In-Pb, Pb-Bi) and first-kind (Sn) materials. The results have been obtained by resistivity, dynamic-susceptibility, penetration-depth, and tunneling measurements.
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