Antiferromagnetic-Resonance Linewidths in Mn<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">F</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>
J. P. KotthausDepartment of Physics, University of California, Santa Barbara, California 93106V. JaccarinoDepartment of Physics, University of California, Santa Barbara, California 93106
1972lv
ABI
Аннотация
The fundamental relaxation mechanisms by which the uniform and magnetostatic modes decay in an antiferromagnet are identified by antiferromagnetic-resonance linewidth observations in Mn${\mathrm{F}}_{2}$ at 4.2\ifmmode^\circ\else\textdegree\fi{}K in fields of 85 kOe. The dependence of the linewidth---0.2 Oe in the narrowest instance---on sample geometry, surface preparation, and impurity concentrations makes quantitative comparison with the Loudon-Pincus theory possible. The predominant relaxation process is surface pit scattering into the degenerate spin-wave manifold in all but the most impure crystals.
Перевод пока недоступен
Идентификаторы
Цитирования и источники
Цитирований: 2Использованных источников: 0