I. Vassilev

1 та иш

Institute of Physics of Bulgarian Academy of Sciences, Sofia, Bulgaria

1. Comparison of X‐ray topographical images in implanted silicon crystals at different absorption conditions

   Z. Furmanik, H. Hubrig, M. Maciaszek +1

   МақолаCrystallography and Radiation PhenomenaKristall und Technik19790 иқтибос

   ABIABI:AkademIndex/openalex/1979.article.000080