P. Charvát

1 та иш

Department of Chemical Technology of Electronics Materials, Institute of Chemical Technology, 166 28, Prague, Czechoslovakia

1. Depth profiles of Sb atoms implanted into Ti

   V. Havránek, V. Hnatowicz, J. Kvítek +3

   МақолаIon-surface interactions and analysisRadiation effects and defects in solids19910 иқтибос

   ABIABI:AkademIndex/openalex/1991.article.000077