A. Waag

1 та иш

Braunschweig University of Technology 1 Institute of Semiconductor Technology, , 38106 Braunschweig, Germany

1. Photoassisted Kelvin probe force microscopy at GaN surfaces: The role of polarity

   Jiandong Wei, S. F. Li, A. É. Atamuratov +2

   МақолаForce Microscopy Techniques and ApplicationsApplied Physics Letters20100 иқтибос

   ABIABI:AkademIndex/openalex/2010.article.000061