Cyrian Leriche

1 та иш

Advanced Research Center for NanoLithography, University of Amsterdam, Science Park 106, 1098 XG Amsterdam, The Netherlands

1. The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of Topography

   Asima Pradhan, Martin H. Müser, N. Miller +97

   МақолаSurface Roughness and Optical MeasurementsTribology Letters20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.000091