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Structure of thin films of solidified N2–Xe and N2–Kr binary mixtures

S. I. KovalenkoPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Khar’kovI. N. KrupskiĩPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Khar’kovA. A. SolodovnikPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Khar’kov
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Аннотация

The structure of solidified N2–Xe and N2–Kr mixtures was studied by transmission electron diffraction. Observations were carried out in the temperature range from 2.5 to 30 °K on specimens prepared at 2.5, 20, 25, and 28 °K by condensation from the gas phase. The influences of composition, deposition temperature, and also of subsequent heating on the structure of the condensates were established. The form of the phase diagrams of the systems studied was deduced from an analysis of the experimental results. It was shown that the orientational order of the N2 molecules is destroyed as the inert gas content is increased. The observed disorientation occurred in the process of forming the specimens from the gas phase.

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