X ray diffraction investigation of the thermal expansion of CsDy(MoO4)2
S. D. El’chaninovaPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov; and M. V. Lomonosov State University, MoscowA. I. ZvyaginPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov; and M. V. Lomonosov State University, MoscowЗ. А. КазейPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov; and M. V. Lomonosov State University, Moscow
ABI
Аннотация
We have studied the temperature dependence of the thermal expansion coefficient of CsDy(MoO4)2 in the temperature range 30–300 °K. A sharp anomaly in the anisotropy of the thermal expansion coefficient, characteristic of layered crystals, is found. It is established that in the vicinity of the phase transition there is a large negative peak in the coefficient α100 and a much smaller positive peak in α0l0.
Ҳали таржима қилинмаган
Мавзулар
Идентификаторлар
Иқтибослар ва манбалар
0 та иқтибос0 та фойдаланилган манба