Ушбу иш иқтибос қилган ишлар

6 та иш

Иш: Depth profiles of Sb atoms implanted into Ti

1. THE STOPPING AND RANGE OF IONS IN SOLIDS

   J. F. Ziegler

   Боб198815 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.034967

2. Silicides for VLSI applications

   S. P. Murarka

   Китоб19836 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212580

3. Concepts of Backscattering Spectrometry

   Wei‐Kan Chu, James W. Mayer, Marc‐A. Nicolet

   Боб19782 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.527496

4. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.659124

5. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.659125

6. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.659126