Electron-diffraction studies of solidified CO2-Xe mixtures

The structure of condensed CO2–Xe films is studied in the temperature range 6–60 K. Gaseous mixtures whose composition varied from 0 to 100% Xe were condensed on substrates at temperatures 55 and 6 K. It is found that up to 5 mol.% Xe is dissolved in the CO2 matrix during high-temperature deposition, while the dissolution of CO2 in Xe is below the sensitivity of the x-ray diffraction technique. The structure and substructure of low-temperature condensates are studied as well as the kinetics of relaxation processes stimulated by the annealing of these films.

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