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Radiofrequency size effect in metals with a real surface

М. А. ЛурьеB. I. Verkin Physicotechnical Institute of Low Temperatures, Ukrainian Academy of Sciences, 310164 Kharkov
Low Temperature Physicsjournal1994en
ABI

Аннотация

The method developed earlier by Lur’e et al. [J. Low Temp. Phys. 56, 277 (1984)] for investigating the propagation of electromagnetic waves in metal plates is used to study the surface state of a metal with the help of radiofrequency size effect (RSE). It is shown that the surface scattering of electrons practically does not affect the RSE in quite thin plates. In comparatively thick plates, however, the main characteristics of the effect are sensitive to surface scattering, and the width and amplitude of RSE lines are determined by microscopic characteristics of the surface. Under these conditions, the dependence of the main characteristics of the effect on the electromagnetic wave frequency, electron mean free path, and sample thickness is studied in detail. The results of investigations are presented in a compact form and are convenient for comparison with the experimental data.

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