Low Temperature Phase Transition (Pt) and Defect Formation (Df) in Silicon with Dioxide Inclusions Under X-Ray Irradiation
Sh. MakhkamovInstitute of Nuclear Physics, Uzbekistan Academy of Sciences, Tashkent, 702132, UzbekistanS. N. AbdurakhmanovaInstitute of Nuclear Physics, Uzbekistan Academy of Sciences, Tashkent, 702132, Uzbekistan
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