Мақола

Focusing of a Compensated Nonuniform Electron Beam

S. V. AdamenkoNational scientific centre of Kharkov physicotechnical instituteВ. В. ДолгополовNational scientific centre of Kharkov physicotechnical instituteYu. V. KirichenkoThe National Scientific Center, "Kharkiv Institute of Physics and Technology", 1 Akademichna St., 61108 Kharkiv, UkraineV.A. StratienkoNational scientific centre of Kharkov physicotechnical institute

Telecommunications and Radio Engineeringjournal1999en

ABI

Аннотация

This shows the manner in which the influence nonuniformity of a compensated electron beam on its focusing close to a target is investigated. This shows the manner in which the increase of the beam uniformity improves its focusing.

Ҳали таржима қилинмаган

Мавзулар

Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques Advanced X-ray Imaging Techniques

Идентификаторлар

DOI: 10.1615/telecomradeng.v53.i2.150

Иқтибослар ва манбалар

0 та иқтибос0 та фойдаланилган манба

Кўрсаткичлар — AkademScholar