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X-RAY MEASUREMENT OF ICF TARGET USING SURFACE PROFILER SCANNING

Yuan Liuqiong, LUO Qing, WANG Ming da Institute of Nuclear Physics and Chemistry, CAEP, P

High Power Laser and Particle Beamsjournal2000en

ABI

Аннотация

The X ray radiography technique for measurement of ICF targets. Record film images of microspheres using contact microradiography. Analysis the X ray images using surface profiler, direct measuring the wall thickness of single wall microsphere. Comparsed this measurement with the optical interferometric measurement and found measurement differences 0.3μm.

Ҳали таржима қилинмаган

Мавзулар

Optical measurement and interference techniques Medical Imaging Techniques and Applications Optical Systems and Laser Technology

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