Study of third-and fifth-order nonlinear optical processes in thin C60 films

The nonlinear refraction in thin films of fullerene C60 (100 nm) is studied by the Z-and RZ-scan methods using the second harmonic of a picosecond Nd:YAG laser (λ = 532 nm, τ = 55 ps). The combined effect of n 2 (self-focusing of laser radiation) and n 4 (self-defocusing) is analyzed. Mechanisms responsible for the nonlinear refraction in films are discussed.

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