Ушбу иш иқтибос қилган ишлар

5 та иш

Иш: Current Analysis of Ion Implanted p<sup>+</sup>/n 4H-SiC Junctions: Post-Implantation Annealing in Ar Ambient

1. Double Injection in Insulators

   Murray A. Lampert

   Мақола19622 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.529502

2. Performance limiting surface defects in SiC epitaxial p-n junction diodes

   Tsunenobu Kimoto, N. Miyamoto, H. Matsunami

   Мақола19992 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.529505

3. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.529501

4. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.529503

5. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.529504