<title>Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect</title>

The results of theoretical investigations of the off-axis Z-scan technique for the measurement of nonlinear refraction in materials are presented. The normalized transmittances are calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude (T_pv) and the distance between maximum and minimum (Z_pv) on the aperture radius is analyzed.

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