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Иш: Effect of different chemical treatments of surface on the height of Al-p-SiGe and Au-n-SiGe barriers
Surface barrier detectors using aluminum on n- and p-type silicon for α-spectroscopy
H. Rahab, A. Keffous, H. Menari +3
Мақола20013 иқтибосABIBarrier heights and silicide formation for Ni, Pd, and Pt on silicon
G. Ottaviani, K. N. Tu, J. W. Mayer
Мақола19812 иқтибосABIMetal–semiconductor junctions on <i>p</i>-type strained Si1−<i>x</i>Ge<i>x</i> layers
Omer Nur, M. Willander, Raşit Turan +2
Мақола19962 иқтибосABISputtered gold as an effective Schottky gate for strained Si∕SiGe nanostructures
G. D. Scott, M. Xiao, H. W. Jiang +2
Мақола20072 иқтибосABIModification of Al/Si interface and Schottky barrier height with chemical treatment
Zs. J. Horváth, M. Ádám, I.A. Szabó +2
Мақола20022 иқтибосABI