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Иш: Structural changes induced by argon ion irradiation in TiN thin films
Simulated annealing analysis of Rutherford backscattering data
N.P. Barradas, C. Jeynes, R.P. Webb
Мақола19975 иқтибосABISingle layer and multilayer wear resistant coatings of (Ti,Al)N: a review
Шарҳ мақола20024 иқтибосABIOn high dose nitrogen implantation of PVD titanium nitride
Yurii P. Sharkeev, S.J. Bull, A.J. Perry +5
Мақола20052 иқтибосABI