Ушбу иш иқтибос қилган ишлар

2 та иш

Иш: A compensation method for measuring the junction temperature of a p +-p-n + silicon structure

1. Physics of Semiconductor Devices

   J.-P. Colinge, Cindy Colinge

   Китоб200258 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.199260

2. Physics of Semiconductor Devices

   Simon M. Sze, Kwok K. Ng

   Китоб200633 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.109944