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Иш: Cluster projectile ions used for the SIMS analysis of silicon

1. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

   Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov

   МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20213 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.415083