Average decay rate constants and excitation energies for metal clusters sputtered by SF+5 and inert gas ions
С. Е. МаксимовInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanН. Х. ДжемилевInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanС. Ф. КоваленкоInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanV. I. TugushevInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanО. Ф. ТукфатуллинInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanШ. Т. ХожиевInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, Uzbekistan
ABI
Аннотация
Results from a comparative SIMS study of the fragmentation of metal clusters sputtered with atomic Xe+ and molecular SF 5 + ions are presented. It is shown that the average decay rate constants and, hence, the excitation energies of clusters of the same stoichiometry do not depend on the type of bombarding ions.
Ҳали таржима қилинмаган
Мавзулар
Идентификаторлар
Иқтибослар ва манбалар
0 та иқтибос14 та фойдаланилган манба
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