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Иш: Study of Ion Scattering Process by the Method of Binary Collision Approximation
Effect of Ion Refocusing and Focusing at the Ne and Ar Small Angle Ion Bombardment on the Surface III-V Compound Semiconductors
Karimov Muxtor Karimberganovich, Sadullaev Shuxrat Ravshanovich, Sobirov Ravshanbek Yuldashbaevich
МақолаIon-surface interactions and analysisInternational Journal of Trend in Scientific Research and Development20180 иқтибосABI