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Иш: Effect of Ion Refocusing and Focusing at the Ne and Ar Small Angle Ion Bombardment on the Surface III-V Compound Semiconductors
The ion dechanneling mechanism at grazing scattering on the surface atomic steps
A.A. Dzhurakhalov, B.S. Kalandarov, Uchkun Kutliev +1
МақолаAdvanced Chemical Physics Studies2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432)20021 иқтибосABI