X-ray properties of the X-CLASS-redMaPPer galaxy cluster sample: the luminosity–temperature relation

ABSTRACT This article presents the results of a spectroscopic analysis of the X-CLASS-redMaPPer (XC1-RM) galaxy cluster sample. X-CLASS is a serendipitous search for clusters in X-ray wavebands based on the XMM–Newton archive, whereas redMaPPer is an optical cluster catalogue derived from the Sloan Digital Sky Survey (SDSS). The present sample comprises 92 X-ray extended sources identified in optical images within 1 arcmin separation. The area covered by the cluster sample is ∼ 27 deg2. The clusters span a wide redshift range (0.05 < z < 0.6) and 88 clusters benefit from spectrosopically confirmed redshifts using data from SDSS Data Release 14. We present an automated pipeline to derive the X-ray properties of the clusters in three distinct apertures: R500 (at fixed mass overdensity), Rfit (at fixed signal-to-noise ratio) and ${R}_{300\, {\rm kpc}}$ (fixed physical radius). The sample extends over wide temperature and luminosity ranges: from 1–10 keV and from 6 × 1042 to 11 × 1044 erg s−1, respectively. We investigate the luminosity–temperature (L–T) relation of the XC1-RM sample and find a slope equal to 3.03 ± 0.26. It is steeper than predicted by self-similar assumptions, in agreement with independent studies. A simplified approach is developed to estimate the amount and impact of selection biases that might be affecting our recoveredL–Tparameters. The result of this simulation process suggests that the measuredL–Trelation is biased to a steeper slope and higher normalization.

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