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Gas-Sensitive Material for Semiconductor Hydrogen Sulfide Sensor

Abdurakhmanov ErgashboyDepartment of Analytical Chemistry of Samarkand State University named after Sh.Rashidov. Samarkand, UzbekistanBegmatov RizamatDepartment of Analytical Chemistry of Samarkand State University named after Sh.Rashidov. Samarkand, UzbekistanAbdurakhmanov IlkhomDepartment of Analytical Chemistry of Samarkand State University named after Sh.Rashidov. Samarkand, Uzbekistan
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Аннотация

In this work, the synthesis of porous silica gas-sensitive materials for semiconductor sensors of hydrogen sulfide is presented. As a result of studying the activity and selectivity of individual and binary oxides in the oxidation of combustible gases, the composition of the catalyst (10CuO + 90WO3) for the gas-sensitive element of the H2S sensor was selected. The selected catalysts ensure high semiconductor sensor (SCS) selectivity in a wide range of temperatures and H2S concentrations. The optimal ratio of the initial components for the synthesis of silica gas-sensitive materials for a semiconductor hydrogen sulfide sensor has been selected. It has been established that the period of maturation of the film-forming solution based on tetraethoxysilane (TEOS) is 6.5 hours, the period that ensures the production of gas-sensitive films is 18.5 days, and the aging period is 3.5 days. It was found that an increase in the process temperature from 20 to 40°C with a slight change in the viscosity of the solution leads to a sharp reduction in the stability time of the solution from 18.5 to 7.5 days.

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