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30 та иш

Иш: Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

  1. Checkability of the digital components in safety-critical systems: Problems and solutions

    Oleksandr Drozd, Vyacheslav Kharchenko, Svetlana Antoshchuk +2

    Мақола201112 иқтибос
    ABI

  2. Self-Dual Complement Method up to Constant-Weight Codes for Arrangement of Combinational Logical Circuits Concurrent Error-Detection Systems

    Д.В. Ефанов, Valery Sapozhnikov, Vladimir Sapozhnikov +2

    Мақола201911 иқтибос
    ABI

  3. Code Design for Dependable Systems

    Eiji Fujiwara

    Китоб20059 иқтибос
    ABI

  4. Self‐checking Synchronous FSM Network Design with Low Overhead

    A. Matrosova, Ilya Levin, S. Ostanin

    Мақола19998 иқтибос
    ABI

  5. Error Detecting and Error Correcting Codes

    R. W. Hamming

    Мақола19507 иқтибос
    ABI

  6. Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs

    E.S. Sogomonyan, M. Goessel

    Мақола19937 иқтибос
    ABI

  7. Fault Detection Capabilities of Alternating Logic

    Reynolds, Metze

    Мақола19787 иқтибос
    ABI

  8. The Hybrid Structure of a Self-Dual Built-In Control Circuit for Combinational Devices with Pre-Compression of Signals and Checking of Calculations by Two Diagnostic Parameters

    Д.В. Ефанов, Д. В. Пивоваров

    Мақола20217 иқтибос
    ABI

  9. New Self‐dual Circuits for Error Detection and Testing

    А. Л. Дмитриев, V. Saposhnikov, V.V. Saposhnikov +3

    Мақола19997 иқтибос
    ABI

  10. Properties Investigation of Self-Dual Combinational Devices with Calculation Control Based on Hamming Codes

    Д.В. Ефанов, Tatiana S. Pogodina

    Мақола20237 иқтибос
    ABI

  11. Methods of Providing Hardware Safety for Microprocessor Train Control Systems

    P. F. Bestem’yanov

    Мақола20206 иқтибос
    ABI

  12. Experimental study on Hamming and Hsiao codes in the context of embedded applications

    Grigor Tshagharyan, G. Harutyunyan, S. Shoukourian +1

    Мақола20176 иқтибос
    ABI

  13. Design and Test Technology for Dependable Systems-on-Chip

    Ubar, Raimund, Raik, Jaan 1972-, Vierhaus, Heinrich Theodor

    Китоб20114 иқтибос
    ABI

  14. Logic Complement, a New Method of Checking the Combinational Circuits

    M. Gessel', Alexandre V. Morozov, Vladimir Sapozhnikov +1

    Мақола20034 иқтибос
    ABI

  15. Checking Combinational Circuits by the Method of Logic Complement

    M. Goessel, Alexandre V. Morozov, Vladimir Sapozhnikov +1

    Мақола20054 иқтибос
    ABI

  16. Experimental Results for Self-Dual Multi-Output Combinational Circuits

    V.V. Saposhnikov, Vl. Moshanin, V.V. Saposhnikov +1

    Мақола19994 иқтибос
    ABI

  17. A New Design Method for Self-Checking Unidirectional Combinational Circuits

    V.V. Saposhnikov, A. Morosov, V.V. Saposhnikov +1

    Мақола19984 иқтибос
    ABI

  18. Adaptive BIST for Concurrent On-Line Testing on Combinational Circuits

    Vasileios Chioktour, Athanasios Kakarountas

    Мақола20224 иқтибос
    ABI

  19. Сарлавҳасиз

    Бошқа3 иқтибос
    ABI

  20. Self-Dual Digital Devices with Calculations Testing by Modified Hamming Code

    Д.В. Ефанов, Tatiana S. Pogodina

    Мақола20233 иқтибос
    ABI

  21. Cyber Physical Computing for IoT-driven Services

    Vladimir Hahanov

    Китоб20182 иқтибос
    ABI

  22. Application of Error Detection and Correction Techniques to Self-Checking VLSI Systems: An Overview

    A R Sahana, V Chiraag, Gautham Suresh +2

    Мақола20232 иқтибос
    ABI

  23. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  24. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  25. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI