Influence of partially known parameter on flaw characterization in Eddy Current Testing by using a random walk MCMC method based on metamodeling
Caifang CaiL2S-SUPELEC, 3 Rue Joliot-Curie, 91192 Gif sur Yvette, FranceThomas RodetSATIE, ENS-Cachan, 61 Avenue du Président Wilson, 94230 Cachan, FranceMarc LambertL2S-SUPELEC, 3 Rue Joliot-Curie, 91192 Gif sur Yvette, France
2014en
ABI
Аннотация
International audience
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