Асосий контентга ўтиш
AkademIndex

Маҳсулотлар

Ишлаб чиқувчилар учун

AkademBaseЭкотизим учун очиқ API
Мақола

High-efficiency sub-microscale uncertainty measurement method using pattern recognition

Chenyang ZhaoSchool of Mechanical Engineering and Automation, Harbin Institute of Technology, Shenzhen 518055, China; State Key Laboratory of Ultra-precision Machining Technology, Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, ChinaChi Fai CheungState Key Laboratory of Ultra-precision Machining Technology, Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, ChinaPeng XuSchool of Mechanical Engineering and Automation, Harbin Institute of Technology, Shenzhen 518055, China; State Key Laboratory of Ultra-precision Machining Technology, Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China; Singapore Institute of Manufacturing Technology, 73 Nanyang Drive, 637662, Singapore. Electronic address: [email protected]
2020en
ABI

Аннотация

Аннотация мавжуд эмас.

Идентификаторлар

Иқтибослар ва манбалар

15 та иқтибос0 та фойдаланилган манба