In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching
Yu ChenBeijing Synchrotron Radiation Laboratory, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, ChinaSaimeng LiSchool of Materials Science and Engineering, Tianjin Key Laboratory of Molecular Optoelectronic Science, Tianjin University, Key Laboratory Organic Integrated Circuits, Ministry of Education, and Collaborative innovation Center of Chemical Science and Engineering (Tianjin), Tianjin, ChinaZhibang ShenBeijing Synchrotron Radiation Laboratory, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, ChinaChunlong SunSchool of Materials Science and Engineering, Tianjin Key Laboratory of Molecular Optoelectronic Science, Tianjin University, Key Laboratory Organic Integrated Circuits, Ministry of Education, and Collaborative innovation Center of Chemical Science and Engineering (Tianjin), Tianjin, ChinaJintao FengSchool of Materials Science and Engineering, Tianjin Key Laboratory of Molecular Optoelectronic Science, Tianjin University, Key Laboratory Organic Integrated Circuits, Ministry of Education, and Collaborative innovation Center of Chemical Science and Engineering (Tianjin), Tianjin, ChinaLong YeSchool of Materials Science and Engineering, Tianjin Key Laboratory of Molecular Optoelectronic Science, Tianjin University, Key Laboratory Organic Integrated Circuits, Ministry of Education, and Collaborative innovation Center of Chemical Science and Engineering (Tianjin), Tianjin, China
2024en
ABI
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