Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method
Alex DolgonosDepartment of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USAThomas O. MasonDepartment of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USAKenneth R. PoeppelmeierDepartment of Chemistry, Northwestern University, Evanston, IL 60208, USA
2016en
ABI
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