Low-temperature instability of Ti<sub>2</sub>SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations
J. ZhangGraduate School of Chinese Academy of Sciences, Beijing, 100039, ChinaB. LiuGraduate School of Chinese Academy of Sciences, Beijing, 100039, ChinaJingyang WangGraduate School of Chinese Academy of Sciences, Beijing, 100039, ChinaYanchun ZhouGraduate School of Chinese Academy of Sciences, Beijing, 100039, China
2009en
ABI
Аннотация
Аннотация мавжуд эмас.
Идентификаторлар
Иқтибослар ва манбалар
2 та иқтибос0 та фойдаланилган манба