Analysis of Z-scan of thick media with high-order nonlinearity by variational approach
Zhibo LiuPhotonic Center, Institute of Physics, Nankai University, Tianjin 300071, PR ChinaWei-Ping ZangPhotonic Center, Institute of Physics, Nankai University, Tianjin 300071, PR ChinaJianguo TianPhotonic Center, Institute of Physics, Nankai University, Tianjin 300071, PR ChinaWenyuan ZhouPhotonic Center, Institute of Physics, Nankai University, Tianjin 300071, PR ChinaChunping ZhangPhotonic Center, Institute of Physics, Nankai University, Tianjin 300071, PR ChinaGuangyin ZhangPhotonic Center, Institute of Physics, Nankai University, Tianjin 300071, PR China
2003en
ABI
Аннотация
Аннотация мавжуд эмас.
Идентификаторлар
Иқтибослар ва манбалар
3 та иқтибос0 та фойдаланилган манба