Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis
M. K. TiwariSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaB. GowrishankarSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaVikas RaghuvanshiSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaR.V. NandedkarSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaKawal SawhneySynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, India
2002en
ABI
Аннотация
Аннотация мавжуд эмас.
Идентификаторлар
Иқтибослар ва манбалар
2 та иқтибос0 та фойдаланилган манба