Z-scan measurements of the anisotropy of nonlinear refraction and absorption in crystals
Richard DeSalvoCenter for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, Florida 32816Mansoor Sheik‐BahaeCenter for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, Florida 32816A. A. SaidCenter for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, Florida 32816David J. HaganCenter for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, Florida 32816Eric W. Van StrylandCenter for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, Florida 32816
1993en
ABI
Аннотация
We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction in crystals by incorporating a wave plate into the Z-scan apparatus. We demonstrate this method by measuring the polarization dependence of the nonlinear refractive index or two-photon absorption coefficient in BaF2, KTP, and GaAs at wavelengths of 532 and 1064 nm.
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