Ушбу иш иқтибос қилган ишлар

6 та иш

Иш: Electronic structure and optical properties of CaF2 films under low energy Ba+ ion-implantation combined with annealing

1. Silicides for VLSI applications

   S. P. Murarka

   Китоб19836 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212580

2. Ion Implantation in Semiconductors

   James W. Mayer, O. J. Marsh

   Боб19695 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212581

3. Auger electron spectroscopy and electron energy loss spectroscopy studies of the formation of silicon nitride by implanting low energy nitrogen ions into silicon

   N. Lieske, Rudolf Hezel

   Мақола19813 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212584

4. Special Applications

   S. P. Murarka

   Боб19833 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212585

5. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212582

6. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212583