Китоб

Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. GoldsteinUniversity of Massachusetts, Amherst, USADale E. NewburyNational Institute of Standards and Technology, Gaithersburg, USAJoseph R. MichaelSandia National Laboratories, Albuquerque, USANicholas W. M. RitchieNational Institute of Standards and Technology, Gaithersburg, USAJohn Henry J. ScottNational Institute of Standards and Technology, Gaithersburg, USADavid C. JoyUniversity of Tennessee, Knoxville, USA

2017en

ABI

Аннотация

Аннотация мавжуд эмас.

Идентификаторлар

DOI: 10.1007/978-1-4939-6676-9

Иқтибослар ва манбалар

3 та иқтибос0 та фойдаланилган манба

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