Ушбу ишга иқтибос қилган ишлар

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Иш: Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition

   U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +4

   МақолаSemiconductor materials and devicesThin Solid Films202113 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.144461