On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study
Michael NiehlePaul-Drude-Institut für Festkörperphysik, Hausvogteiplatz 5-7, 10117 Berlin, GermanyJean‐Baptiste RodriguezCNRS, IES, UMR 5214, F-34000 Montpellier, FranceL. CeruttiCNRS, IES, UMR 5214, F-34000 Montpellier, FranceE. TourniéCNRS, IES, UMR 5214, F-34000 Montpellier, FranceA. TrampertPaul-Drude-Institut für Festkörperphysik, Hausvogteiplatz 5-7, 10117 Berlin, Germany
2017en
ABI
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