Ушбу иш иқтибос қилган ишлар

6 та иш

Иш: Formation of Cobalt Impurity Microinclusions in Silicon Single Crystals

1. Silicides for VLSI applications

   S. P. Murarka

   Китоб19836 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.212580

2. Dopant microassociation mechanisms in Si〈Mn〉 and Si〈Ni〉

   С. З. Зайнабидинов, K. N. Musaev, N. A. Turgunov +1

   Мақола20126 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.385117

3. Electrical properties of plastically deformed silicon due to its interaction with an iron impurity

   O. V. Feklisova, E. B. Yakimov

   Мақола20112 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.379723

4. Precipitation of cobalt in silicon studied by Mössbauer spectroscopy

   W. Bergholz, W. Schröter

   Мақола19782 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.503350

5. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.503351

6. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.503352