Method for system-independent material characterization from spectral X-ray CT
Matteo BusiLawrence Livermore National Laboratory, Livermore, CA, 94551, USAK. Aditya MohanLawrence Livermore National Laboratory, Livermore, CA, 94551, USAAlex A. DooraghiLawrence Livermore National Laboratory, Livermore, CA, 94551, USAKyle ChampleyLawrence Livermore National Laboratory, Livermore, CA, 94551, USAH.E. MartzLawrence Livermore National Laboratory, Livermore, CA, 94551, USAUlrik L. OlsenTechnical University of Denmark, DTU Physics, 2800, Kgs. Lyngby, Denmark
2019en
ABI
Аннотация
Аннотация мавжуд эмас.
Идентификаторлар
Иқтибослар ва манбалар
3 та иқтибос0 та фойдаланилган манба