Automatic fabric defect detection using a wide-and-light network
Jun WuSchool of Electronics and Information Engineering, Tiangong University, Tianjin, 300387, ChinaJuan LeSchool of Electronics and Information Engineering, Tiangong University, Tianjin, 300387, ChinaZhitao XiaoSchool of Life Sciences, Tiangong University, Tianjin, 300387, ChinaFang ZhangSchool of Life Sciences, Tiangong University, Tianjin, 300387, ChinaLei GengSchool of Life Sciences, Tiangong University, Tianjin, 300387, ChinaYanbei LiuSchool of Life Sciences, Tiangong University, Tianjin, 300387, ChinaWen WangSchool of Life Sciences, Tiangong University, Tianjin, 300387, China
2021en
ABI
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