Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Revealing inconsistencies in X-ray width methods for nanomaterials

1. Correlation between thickness-dependent morphology, phase structure, and vibrational properties of TiO2 thin films deposited via DC magnetron sputtering: A multi-technique characterization approach

   Б.Д. Игамов, I. R. Bekpulatov, A.M. Normamatov +2

   МақолаZnO doping and propertiesNext Materials20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.001679

2. Comprehensive analysis of thickness-dependent structural, morphological, and optical properties of TiO2 based thin films

   B.D. Igamov, I.R. Bekpulatov, A.M. Normamatov +3

   МақолаTiO2 Photocatalysis and Solar CellsResults in Optics20260 иқтибос

   ABIABI:AkademIndex/openalex/2026.article.000275