<title>Chalcogenide glass thin films: Z-Scan measurements of refractive index changes</title>
Francesco MichelottiM. BertolottiValentin N. CiumashAcademy of Sciences of Moldova, MoldovaA. M. AndrieshAcademy of Sciences of Moldova, Moldova
1993en
ABI
Аннотация
Nonlinear properties of chalcogenide glass As2S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.
Ҳали таржима қилинмаган
Идентификаторлар
Иқтибослар ва манбалар
2 та иқтибос0 та фойдаланилган манба