Ушбу иш иқтибос қилган ишлар

4 та иш

Иш: Analysis of profiles of atomic distribution over the depth of Si-Me free nanofilm systems

1. Synchrotron investigations of Si/Mo/Si…c-Si (100) multilayer nanoperiodic structures

   É. P. Domashevskaya, V. A. Terekhov, S. Yu. Turishchev +5

   Мақола20133 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.397009

2. Preparation of Step-free Single Crystal Metal Films with Desired Surface Orientations by Means of Vacuum Evaporation

   Kenji Wakashima, Masatoshi Fukamachi, Sigemaro Nagakura

   Мақола19692 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.495097

3. Energy distribution of metal and noble gas ions traversing single-crystal copper films

   З. А. Исаханов

   МақолаIon-surface interactions and analysisTechnical Physics20122 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.531187

4. Сарлавҳасиз

   Бошқа1 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.531186